table of contents
May [General] Newsletter
Examiner consultations with the Korea Intellectual Property Office and the European Patent Office.
The Japan Patent Office (JPO) has conducted examiner consultations with foreign intellectual property offices for many years. These consultations aim to foster trust and deepen mutual understanding between the JPO and foreign intellectual property offices through discussions between examiners from both sides regarding each other's prior art search methods and examination practices, and to promote the mutual use of prior art search results and examination results.
As part of this examiner consultation initiative, examiner consultations between the JPO and the Korea Intellectual Property Office (MOIP), and between the JPO and the European Patent Office (EPO), were held from March 9 to 13, 2026.
The aforementioned examiner consultation between the JPO and MOIP was conducted in the form of MOIP examiners being accepted into the JPO. During the consultation, information was exchanged on common patent applications in two fields: robotics and glass technology, as well as on methods for prior art document searches, including the use of commercial databases, FIs, and F-terms, and the application of examination standards. Furthermore, the consultation also included an exchange of opinions on the use of AI in patent examination at both the JPO and MOIP, involving JPO staff responsible for examination tool development.
Therefore, it is expected that through examiner consultations between the JPO and MOIP, the mutual utilization of each other's examination results in the fields of robotics and glass technology will be promoted, leading to faster examinations. Furthermore, it is expected that the use of AI in patent examination will advance at both the JPO and MOIP.
The aforementioned examiner consultations between the JPO and the EPO were conducted by having JPO examiners dispatched to the EPO's Munich office. During these consultations, information was exchanged on prior art search methods, including non-patent literature, the application of examination standards, and patent classification policies in the two fields of batteries and mobile communication systems. Furthermore, the consultations also included an exchange of views on the use of AI in examination and classification processes at both offices.
Therefore, it is expected that through the examiner consultations between the JPO and the EPO, the mutual utilization of each other's examination results in the fields of batteries and mobile communication systems will be promoted, leading to faster examinations. Furthermore, it is also expected that the EPO will further advance the use of AI in patent examination.
Publication of the Japan Patent Office Status Report 2026
On March 23, 2026, the Japan Patent Office (JPO) published the "JPO Status Report 2026," which contains statistics and policy achievements regarding intellectual property for 2025. The "JPO Status Report 2026" describes the current state of the intellectual property system and the JPO's initiatives.
The "Japan Patent Office Status Report 2026" includes, for example, the following information:
- Intellectual property trends in Japan and overseas, including the number of applications (patents, utility models, designs, trademarks) in Japan and overseas from 2016 to 2025.
- Contents of the forum exhibited by the Japan Patent Office at the Osaka World Expo in October 2025
- Contents of policies and legal amendments implemented by the Japan Patent Office in 2025
Furthermore, the "Japan Patent Office Status Report 2026" is written in both Japanese and English on every page, making it a valuable resource for both domestic and international use, as it compiles the latest intellectual property information.
The "Japan Patent Office Status Report 2026" is available on the Japan Patent Office website (https://www.jpo.go.jp/resources/report/statusreport/2026/index.htmlIt can be downloaded from ).
Furthermore, the "Japan Patent Office Status Report 2026" booklet will be available for free distribution from late April 2026 at the contact points listed in 1. and 2. below.
- Japan Patent Office Application Division Reception Counter and International Application Office Reception Counter (1st floor of the Japan Patent Office main building)
- National Institute of Industrial Property Information and Training (INPIT) Consultation Desk (1st floor, Japan Patent Office Main Building)
Furthermore, the aforementioned booklet will be distributed free of charge at comprehensive intellectual property support centers throughout Japan, starting in early May 2026, making it readily available.
However, please note that the distribution will end once supplies run out.
In addition, the aforementioned booklet will be available for viewing at the Japan Patent Office Library from mid-May 2026 onwards.
Revision of the Standards Examination Manual
The Japan Patent Office has periodically reviewed and revised the contents of its Formal Examination Manual in response to legal amendments and the resulting changes in operational procedures, and has published the contents of such revisions.
On March 25, 2026, a revision of the Examination Guidelines was published and came into effect on April 1, 2026.
The revisions can be summarized as follows: (1) to (3).
(1) In conjunction with the partial enforcement of the Act Partially Amending the Unfair Competition Prevention Act, etc. (effective date: April 1, 2026), this revision adds provisions concerning the online service of process system.
(2) In conjunction with the enforcement of the Ministerial Ordinance Amending Part of the Enforcement Regulations of the Act on Special Provisions for Procedures, etc. Concerning Industrial Property Rights (effective date: April 1, 2026), which abolishes the notification of restrictions on the use of a blanket power of attorney, the provisions concerning the notification of restrictions on the use of a blanket power of attorney will be deleted.
(3) Revisions that involve changes in the description and the creation of new items, etc., in order to change the operation and clarify the operation, as a result of the enforcement of the aforementioned laws and ministerial ordinances.
The revised Examination Manual and the specific details of the revisions can be found on the Japan Patent Office website.https://www.jpo.go.jp/system/laws/rule/guideline/hoshiki-shinsa-binran/kaitei/index.htmlIt can be downloaded from ).
Automatically generated and automatically assigned search index "GAIA-Index" launched.
The Japan Patent Office has been conducting trials to implement "GAIA-Index" (GAIA: Generative AI-based Architecture), an automatically generated and automatically assigned search index utilizing AI technology, into its operations. Now, from April 1, 2026, it is possible to search in F-term format using the aforementioned "GAIA-Index," which has been experimentally generated and assigned for some themes, on the patent information platform "J-PlatPat."
The specific search method for GAIA-Index in J-PlatPat's patent and utility model search (selection input) is as follows:
(1) When using search options
- In the search options, specify the theme with a GAIA-Index (e.g., 3D131) as the primary theme.
- Set the search criteria for search keywords to "F-term".
- The search is performed by specifying the GAIA-Index search key (e.g., OA01) as the F-term.
(2) If you do not use search options
- Set the search criteria for search keywords to "F-term".
- Search by specifying the F-term and the GAIA-Index search key (e.g., 3D131OA01).
Furthermore, the themes currently available for use with "GAIA-Index" are as follows:
- 3D131 (General Tires)
- 3D232 (Steering control that adapts to driving conditions)
- 4C160 (surgical equipment)
- 5F251 (Photovoltaic device)
Therefore, it can be expected that highly accurate searches using AI will become possible for these topics in the future.
Furthermore, the aforementioned "GAIA-Index" will be updated every April with further improvements to its generation and assignment methods and an expansion of the themes covered. The updated "GAIA-Index" will then be reflected in search environments (such as J-PlatPat) in the form of F-terms as needed.
Therefore, it can be expected that, in line with the annual update of the "GAIA-Index" in April, the accuracy of searches using the "GAIA-Index" will improve, and the number of themes covered by such searches will also increase.
Newsletter translated into English
Examiner Meetings with the Korean Intellectual Property Office and the European Patent Office
The Japan Patent Office (JPO) has been conducting examiner meetings with foreign intellectual property offices for many years. These examiner meetings are an initiative to build trust and deepen mutual understanding between the JPO and foreign IP offices through discussions between their respective examiners on prior art search methods and examination practices, thereby promoting the mutual use of prior art search and examination results.
As part of these examiner meeting initiatives, from March 9 to 13, 2026, examiner meetings were held between the JPO and the Korean Intellectual Property Office (MOIP), and between the JPO and the European Patent Office (EPO).
The examiner meeting between the JPO and the MOIP was conducted by welcoming examiners from the MOIP to the JPO. Furthermore, during this examiner meeting, discussions were held on patent applications common to both offices in the fields of robotics and glass technology. Information was also exchanged on prior art search methods, including the use of commercial databases, FI, and F-terms, as well as the application of examination guidelines. Additionally, an exchange of views took place on the use of AI in patent examination at both the JPO and the MOIP, with the participation of JPO staff responsible for developing examination tools.
Therefore, through this examiner meeting between the JPO and the MOIP, it is expected that the mutual use of examination results in the fields of robotics and glass technology will be promoted, leading to an acceleration of the examination process. It is also anticipated that the utilization of AI in patent examination will further advance at both the JPO and the MOIP.
The examiner meeting between the JPO and the EPO was conducted by dispatching JPO examiners to the EPO's Munich office. During this examiner meeting, information was exchanged on prior art search methods, including for non-patent literature, in the fields of batteries and mobile communication systems, as well as on the application of examination guidelines and policies for assigning patent classifications.Even, at the examiner meeting an exchange of views took place on the use of AI in examination and classification assignment at both offices.
Therefore, through this examiner meeting between the JPO and the EPO, it is also expected that the mutual use of examination results in the fields of batteries and mobile communication systems will be promoted, leading to an acceleration of the examination process. It is also anticipated that the utilization of AI in patent examination will further advance at the EPO.
Publication of the JPO Status Report 2026
On March 23, 2026, the Japan Patent Office (JPO) published the “JPO Status Report 2026,” which contains statistical information and policy achievements related to intellectual property in 2025. This report describes the current situation surrounding the intellectual property system and the initiatives of the JPO.
The “JPO Status Report 2026” includes, for example, the following items:
- IP trends in Japan and overseas, such as the number of applications (patents, utility models, designs, trademarks) in Japan and abroad from 2016 to 2025
- Details of the forum exhibited by the JPO at the Osaka Expo in October 2025
- Details of measures and law revisions implemented by the JPO in 2025
Furthermore, all pages of “JPO Status Report 2026” are written in both Japanese and English, making it a resource that can be utilized both domestically and internationally as a compilation of the latest IP information.
The “JPO Status Report 2026” can be downloaded from the JPO website (https://www.jpo.go.jp/resources/report/statusreport/2026/index.html).
In addition, printed copies of the “JPO Status Report 2026” will be available for free distribution at the following counters starting from late April 2026:
- Application Division counter and International Application Office counter at the JPO (1st floor of the JPO Main Government Building)
- Consultation desk of the National Center for Industrial Property Information and Training (INPIT) (1st floor of the JPO Main Government Building)
Furthermore, starting from early May 2026, printed copies will be gradually distributed free of charge and become available at the INPIT's IP Comprehensive Support Counters located throughout Japan.
However, please note that the distribution will end once the stock runs out.
In addition, printed copies will be available for viewing at the JPO Library from mid-May 2026 onwards.
Revision of the Formality Examination Manual
The Japan Patent Office has been reviewing and revising the content of the Formality Examination Manual as appropriate in response to legal amendments and associated changes in operational procedures, and has been publishing the details of these revisions.
A revision to the Formality Examination Manual was published on March 25, 2026 and came into effect on April 1, 2026.
The revision includes the following items (1) to (3):
(1) A revision to add provisions concerning the online delivery system, in line with the introduction of this system accompanying the partial enforcement (effective date: April 1, 2026) of the Act for the Partial Revision of the Unfair Competition Prevention Act, etc.
(2) A revision to delete provisions concerning the notification of restriction on citation of a general power of attorney, in line with the abolition of this notification of restriction on citation of a general power of attorney accompanying the enforcement (effective date: April 1, 2026) of the Ministerial Ordinance for the Partial Revision of the Regulation for Enforcement of the Act on Special Provisions concerning Procedures relating to Industrial Property Rights, etc.
(3) Revisions involving changes to descriptions and the establishment of new items for the purpose of changing and clarifying operations due to the enforcement of the mentioned Act and Ministerial Ordinance.
The revised Formality Examination Manual and the specific details of the revision can be downloaded from the JPO website (https://www.jpo.go.jp/system/laws/rule/guideline/hoshiki-shinsa-binran/kaitei/index.html).
Launch of “GAIA-Index,” an Automatically Generated and Assigned Search Index
The Japan Patent Office has been conducting demonstrations for the operational introduction of “GAIA-Index” (GAIA: Generative AI-based Architecture), an automatically generated and assigned search index that utilizes AI technology. As of April 1, 2026, it is now possible to conduct searches in the F-term format on the Japan Platform for Patent Information (J-PlatPat) using the “GAIA-Index,” which has been experimentally generated and assigned for some themes.
The specific method for searching with the GAIA-Index in the Patent & Utility Model Search (selection input) of J-PlatPat is as follows.
(1) When using search options:
- In the search options, specify a main theme that has a GAIA-Index (eg, 3D131).
- Set the search item for the search keyword to “F-term”.
- Search by specifying the GAIA-Index search key (eg, OA01) as the F-term.
(2) When not using search options:
- Set the search item for the search keyword to “F-term”.
- Search by specifying the F-term and the GAIA-Index search key (eg, 3D131OA01).
Currently, the themes available for the “GAIA-Index” are as follows:
- 3D131 (General Tires)
- 3D232 (Steering control according to running condition)
- 4C160 (Surgical instruments)
- 5F251 (Photovoltaic devices)
It is expected that highly accurate searches using AI will become possible for these themes in the future.
Furthermore, the “GAIA-Index” is scheduled to be updated every April, with further improvements to its generation and assignment methods, and an expansion of its target themes. The updated “GAIA-Index” will be reflected in search environments (such as J-PlatPat) in the F-term format as needed.
With the annual April updates, it is also expected that the accuracy of searches utilizing the “GAIA-Index” will improve, and the number of searchable themes will also increase.